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Self-portrait | by Thermo Fisher Scientific
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Self-portrait

A charged dielectric hemisphere shaped sample deflected the low-energy primary electron beam in a way that it scanned over the walls of the specimen chamber.

 

Courtesy of Daniel Rigler

 

Image Details

Instrument used: Inspect Family

Magnification: 80

Voltage: 3kV

Spot: 5.0

Working Distance: 9.2

Detector: SE

 

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Taken on September 11, 2012