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environmental scanning electron microscope 4 | by EMSL
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environmental scanning electron microscope 4

The Environmental Scanning Electron Microscope is a new-generation SEM with the ability to image samples under controlled environments and temperatures. The ESEM offers precise 3D section analysis morphology, focused ion beam, electron backscattering diffraction, and energy dispersive x-ray analysis. It is an essential tool for many ceramics, electronics, geochemistry, geology, catalysis, and materials science investigators. EMSL is a Department of Energy national scientific user facility located at PNNL.

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Taken on December 14, 2011