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Zinc Oxide Images from FIB/SEM | by EMSL
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Zinc Oxide Images from FIB/SEM

At the Department of Energy’s EMSL, Ayman Karmin and other scientists use the focused ion beam/scanning electron microscope (FIB/SEM) to study zinc oxide particles. This metal oxide is a wide-bandgap semiconductor material with wide application in the field of optoelectronics, spintronics, piezoelectric transducers, and ultraviolet optoelectronics.


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Taken on May 5, 2010