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Time-of-Flight Secondary Ion Mass Spectrometer

EMSL’s expansive mass spectrometry capabilities enable high-throughput, high-resolution analysis of complex mixtures. These resources are applied to a broad range of scientific studies related to human health, environmental remediation, homeland security, and climate. The Time of Flight Secondary Ion Mass Spectrometer (TOF SIMS) at EMSL is an ultrahigh vacuum surface analytical system. Using this resource, scientists examine surface structure, composition, and chemical state by means of secondary ion detection during ion sputtering.

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Taken on April 16, 2010