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Mass Spectrometer, TOF-SIMS | by EMSL
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Mass Spectrometer, TOF-SIMS

The Time of Flight Secondary Ion Mass Spectrometer (TOF SIMS) at EMSL is an ultrahigh vacuum surface analytical system. Using this resource, scientists examine surface structure, composition, and chemical state by means of secondary ion detection during ion sputtering.

 

For more information, visit www.emsl.pnl.gov

 

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Taken on February 2, 2010