164 024 001
Researcher at BNL loads a silicon wafer sample into the diffractometer at the National Synchrotron Light Source (NSLS) Beamline X20A for her colleagues performing a remote access experiment.
Synchrotron-based x-ray diffraction techniques have become largely automated, yet researchers must still travel from all over the world to Brookhaven's National Synchrotron Light Source (NSLS) simply to load their samples and program a few computer parameters before the system takes over.
For more information or additional images, please contact 202-586-5251.
164 024 001
Researcher at BNL loads a silicon wafer sample into the diffractometer at the National Synchrotron Light Source (NSLS) Beamline X20A for her colleagues performing a remote access experiment.
Synchrotron-based x-ray diffraction techniques have become largely automated, yet researchers must still travel from all over the world to Brookhaven's National Synchrotron Light Source (NSLS) simply to load their samples and program a few computer parameters before the system takes over.
For more information or additional images, please contact 202-586-5251.